The easytouse model 4200scs semiconductor characterization system performs lab grade dc device characterization, realtime plotting, and analysis with high precision and subfemtoamp resolution. This advanced parameter analyzer provides intuitive and sophisticated capabilities for semiconductor device characterization by combining unprecedented measurement sensitivity and accuracy with an embedded windows r. This lecture is part of a training session for the keithley 4200scs semiconductor. Model 4200 scs technical data s e m i cond u c t or a greater measure of confidence 4200 s cs semiconductor characterization system technical data configuration options the 4200 scs supports many instrument configurations that can include smus, cv measurement units, pulse generators, and oscilloscopes. Keithley 4200scs test equipment reference manual pdf view. Model 4200 scs semiconductor characterization system declassification and security instructions page 4 of 8 0774300 september 2016 memory devices the following tables list the volatile and nonvolatile memory devices in the standard instrument and listed options. V characterization of mos capacitors using the model 4200. Kite is the primary user interface for the keithley instruments model 4200 semiconductor characterization system scs. Keithley instruments 4200 semiconductor characterization. The model 4200 semiconductor characterization system scs can. Scs semiconductor characterization system introduction maintaining the quality and reliability of gate oxides of mos structures is a critical task in a semiconductor fab.
View and download keithley 4200scs reference manual online. Diode characterization on keithley 4200scs youtube. Learn more about how the keithley 4200a scs parameter analyzer is the best tool for your research and analysis of semiconductor devices, materials and processes. Device characterization with the keithley model 4200scs. The 4200 scs offers the most advanced capabilities available in a fully integrated. A manual prober mode prompts the operator to perform prober opera. Using the wafer map parameters option with cascade.
Customer selfpaced elearning sequence for keithley model 4200 scs semiconductor characterization system overview. Model 4200a parameter analyzer users manual tektronix. Model 4200 scs f intuitive, pointandclick windowsbased environment unique remote preamps extend the resolution of smus to 0. Semiconductor characterization system 4200 scs configured with the 4200 pa remote preamplifiers, offers exceptional low current measurement capability with a resolution of 0. Model 4200scs semiconductor characterization system. Kult the keithley user library tool kult allows test engineers to. Capacitancevoltage cv measurements are commonly used in studying gateoxide quality in detail. It also addresses basic mos physics, proper cv measurement techniques, and parameter extraction from cv test results.
A single fault in the system can expose a person to lethal voltage. Refer to the user documentation for complete product specifications. This lecture is part of a training session for the keithley 4200scs semiconductor characterization system. Semiconductor characterization system technical data helmar. The model 4200 scs ktei combination is the industrys leading semiconductor characterization system. Ieee488 interface allows the model 4200scs to control. Table of contents model 4200a scs parameter analyzer user s manual. Model 4200 scs semiconductor characterization system declassification and security instructions instructions. For additional information, refer to the manual for your cv analyzer and to the 4200 scs reference manual. Model 4200a scs semiconductor characterization system quick start guide.
The easytouse model 4200scs semiconductor characterization system performs lab grade dc and pulse device characterization, realtime plotting, and analysis with high precision and subfemtoamp resolution. The 4200scs offers the most advanced capabilities available in a fully integrated characterization system, including a. We are offering for sale a keithley 4200 scs semiconductor characterization system consisting of. Model 4200scs semiconductor characterization system technical note preparation and setup before the parameter wafer mapping feature can be used, the user must set up both the hardware and software of the controller and the prober.
Keithley model 4200scs semiconductor characterization. Its advanced digital sweep parameter analyzer combines speed and accuracy for deep submicron characterization. Model 4200 scs semiconductor characterization system smus. Keithley interactive test environment kite is designed to let users.
Keithley 4200scsf semiconductor characterization system. Ask for a quote on a used keithley 4200 scs f semiconductor analyzers from testequity at today. The 4200 scs offers the most advanced capabilities available in a fully integrated characterization system. Electrical characterization of photovoltaic materials and solar cells with the keithley model 4200 scs semiconductor characterization system. The easytouse model 4200scs semiconductor characterization system performs lab. The model 4200 scs is a total system solution for electrical characterization of devices, materials and semiconductor processes. Keithley and certain third party suppliers the owners own all right, title and interest in. Model 4200scs semiconductor characterization system from. The 4200 scs is a measurement system that includes instruments for both iv and cv measurements, as well as software, graphics, and mathematical analysis capability. Application libraries included for every technology. These modules give lab users a fill in the blank interface to c language subroutines. The 4200ascs offers the most advanced capabilities available in a fullyintegrated characterization system, including a complete, embedded computer with. The 4200 scs reference manual provide indepth information to help you operate the 4200 scs semiconductor characterization system.
The keithley interactive test environment allows users to gain familiarity quickly with. Realtime auto scaling, end of test auto scaling, or manual scaling. Model 4225 integrates ultrafast voltage waveform generation and currentvoltage measurement capabilities into the model 4200 scs semiconductor characterization system. Model 2635b singlechannel system sourcemeter instrument. With unmatched product selections, testequity offers everything you need to get the job done. Keithley 4200scs semiconductor characterization system. Model 4200a scs parameter analyzer user s manual table of contents. Lab grade dc device characterization the easytouse model 4200 scs semiconductor characterization system performs lab grade dc iv, cv, and pulse device characterization, realtime plotting, and analysis with high precision and subfemtoamp resolution. Model 4200 scs technical data semiconductor 4 4200scs semiconductor characterization system con. The keithley model 4200 scs provides a total system solution for dc iv, cv, and pulse characterization and stress. Thanks to a new software driver, users can control the model 4200 scs semiconductor characterization system while operating within agilent technologies iccap device modeling software environment. This document gives the recommended sequence for customer selfpaced elearning and tooling setup that keithley has found to be effective and efficient for training new users of the keithley model 4200 scs semiconductor.
Complete reference contains manuals, white papers, applications notes. Model 4200 scs software environment table 22 continued smu forcing function summary general type name description and graphical illustrations step current increments a current or voltage to two or more levels, each of which is held constant during the progress step of a current sweep, a voltage sweep. The software of the system is a keithley interactive test environment kite for device characterization application. The model 4225pmu ultra fast iv module is the latest addition to the growing range of instrumenta optional ultrafast voltage source and measurement unit for the model 4200 semiconductor characterization system tion options for the model 4200 scs semiconductor characterization system. Four point probe iv electrical measurements using the. View online reference manual for keithley 4200 scs test equipment or simply click download button to examine the keithley 4200 scs guidelines offline on your desktop or laptop computer. The model 4200scs provides a total system solution for dc iv, cv. Always remove power from the entire test system and discharge any capacitors before. Model 4200 smu medium power source measure unit with or without the model 4200 pa remote preamp option.
To learn more, download a free copy of our new application note, using the model 4200 cvupwr cv power package to make high voltage and high current cv measurements with the model 4200 scs semiconductor characterization system at. The zyvex test system employs a keithley model 4200 semiconductor characterization system scs which is an automated instrument designed to provide iv and cv characterization of semiconductor devices and test structures. Model 4200scs semiconductor characterization system declassification and security instructions instructions. Wafer level advanced parameter measurement system signatone. Keithley user library tool kultallows test engineers to integrate custom. The user manual for the 4200 scs describes basics of getting your system up and running. Application note gate dielectric capacitancevoltage. This advanced parameter analyzer provides intuitive and sophisticated.